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The LUNA DOP-201 Degree of Polarization Meter simultaneously measThe LUNA DOP-201 Degree of Polarization Meter simultaneously measures the degree of polarization (DOP) and power of a light source under test.ures the degree of polarization (DOP) and power of a light source under test.
The LUNA ERM-202 is a rotating-polarizer polarization extinction ratio meter. It is available in single or dual channel versions.
The LCA 510 is a fast and accurate component analyzer that is ideal for production test and quality control. The LCA 510 provides the high throughput and connectivity needed for the manufacturing floor while delivering the extremely high sensitivity and resolution.
The LUNA multiport LPD 100 Log Detector is a useful photodiode amplifier designed to measure low light levels, below – 90 dBm.
LUNA
LWA 7000 SERIES : Lightwave Component Analyzer
LWA 7601-C , LWA 7601-C (with extended rage option)
The LUNA LWA 7601-C Lightwave Component Analyzer is a fast and simple-to-use tool for testing modern optical components and modules, including Photonics Integrated Circuits (PICs). The LWA 7601-C measures and analyzes the Insertion Loss (IL) and Return Loss (RL) distribution, frequency response, as well as length. Optical components are scanned in either reflection or transmission mode.
The LUNA Optical Backscatter Reflectometer (OBR) 4600 is an ultra-high resolution reflectometer that features a spatial sampling resolution of 10 microns, zero dead zone, and backscatter-level sensitivity. The OBR 4600 offers industry leading technology to precisely track loss and polarization states, allowing you to “see inside” your components and systems.
LUNA
OVA 5100 : Optical Vector Analyzer
OVA 5100 , OVA 5013
The Luna OVA 5100 is the fastest, most accurate and economical tool for loss, dispersion and polarization measurements of modern optical networking equipment.
The LUNA PDL-201 uses a patented maximum and minimum search method compliant with TIA/EIA-455-198 to simultaneously measure the Polarization Dependent Loss (PDL), Insertion Loss (IL), and optical power of devices in just 30 ms. Unlike PDL meters that use the polarization scrambling method, the PDL-201’s max-min technique is useful for both low and high values of PDL. And unlike instruments that use a Mueller Matrix technique, the PDL-201 has a wide wavelength range without calibration.
The measurement speed of the instrument combined with the remote control interfaces allow it to work in conjunction with tunable lasers in automatic or semi-automatic test stations.
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