BERT1034B 100G NRZ Bit Error Ratio Tester

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BERT1034B 100G NRZ Bit Error Ratio Tester – BERT1034B 100G NRZ high performance BER tester has built-in pattern generator and error detector. The pattern generator supports NRZ encoding from 1Gbps to 34Gbps. The tester supports multiple patterns and custom patterns

BERT1034B 100G NRZ Bit Error Ratio Tester – เครื่องทดสอบ BER ประสิทธิภาพสูง NRZ 100G BERT1034B มีเครื่องสร้างรูปแบบและตัวตรวจจับข้อผิดพลาดในตัว เครื่องสร้างรูปแบบรองรับการเข้ารหัส NRZ ตั้งแต่ 1Gbps ถึง 34Gbps เครื่องทดสอบรองรับรูปแบบต่างๆ และรูปแบบที่กำหนดเอง

Main Features

  • 1Gbps to 34Gbps NRZ encoding
  • Support multi-level emphasis and de-emphasis
  • Built-in PPG and ED
  • Modular design
  • Support network, USB and other control methods
  • Provide programming interface to support system integration

Main applications

  • Optical module test
  • High speed backplane test

Built-in pattern generator supports data rates of NRZ from 1Gbps to 34Gbps.

BERT integrates the pattern generator that supports a variety of rate configurations. The data rate can be flexibly configured according to the user’s needs, and the UI interface is simple to operate.

Laboratory-grade ultra-low output jitter (Rj≤ 300fs @ 28Gbps).
The differential signal output amplitude of the PPG pattern generator is adjustable from 40mV to 1.1V. It supports built-in amplifiers for scalable output amplitudes up to 4V.

The PPG pattern generator supports output signal’s amplitude adjustable, the source signal amplitude ranging from 40mV to 1.1V. The user can also make the output signal amplitude up to 4V when the built-in amplifier is used as required.

PPG pattern generator supports multi-level de-emphasis (post-cursor and pre-cursor).
Support commonly used patterns (clock pattern, PRBS7, PRBS9, PRBS15,PRBS23,PRBS31, and 64-bit custom pattern).

BERT supports a variety of commonly used PRBS patterns, and users can customize pattern types according to their own needs, greatly expanding the practicability of testing and measurement.

ED of BER tester has clock recovery circuit CDR, no external CDR module required.

The high precision clock recovery circuit module CDR is integrated into the ED of BER tester. Users do not need to configure additional CDR equipment, which not only reduces the cost of measuring equipment, saves space, but also reduces the unnecessary cable connection, helping users to reduce the maintenance difficulty.

ED of BER tester has advanced analysis function (eye contour line, bathtub curve,etc.).

Error code input sensitivity 40mV.

 

Multifunctional

Intelligently display data in a graphical way

The intelligent display of data visualizes the situation of the fiber cores of the curently preset tasks, and uses colors to remindusers of the actual situation of each optical fber link.

Optional single-mode and multi-mode fiber types

The OT-200 series optical switches support optional single-mode and multi-mode fiber types, meeting testing requirements in various environments.

The MPO adapter comes with a built-in dust-proof design

The adapter on the OT-200 device has a built-in dust-proof design,which effectively prevents the port from being contaminated ordamaged when it is not in use.

Small and portable, light weight, one hand operation

Thanks to the excellent ergonomic design and small and portable body shape of Dimension Technology, it can be carried in differentways, young and fashionable. in operation, just press the shortcut key to complete the test, and the data can be automatically analyzedand saved. lt only need a litle training, novice can also complete the communication fault inspection.

Extension

The OTDR can be perfectly integrated into the product ecological chain of Dimension Technology. t can communicate through WiFi orUSB, use Dimension’s app to control other test equipment and become a main device. Besides, it can also be controled by other maindevices throuah WiFi or USB to become a test module in a test system.

Long battery life, unique replaceable smart battery

The whole series of OTDR of dimension technology adopts replaceable high-capacity inteligent batteries. The battery can be chargedindependently, with a ife time of up to 8 hours; The battery can be replaced at any time, So that you can work without worrying aboupower problems.

Adapt to a variety of environments

In order to cope with diferent scenarios and testers of diferent occupations, Dimension technology has made specially improvements for the reliability of such test equipment, making the use of equipment more flexible and applicable.

Specification

Note:

[1]All specifications are applicable at a temperature of 23 °C ± 1 °C

[2]SM Deadzone test conditions: SM 1550/3ns/0.65km/180s; The event reflection coeficient is -45 ± 2dB

[3] MM Deadzone test conditions: MM1300/3ns/0.65km/180s ; The event refection coefficient is -45 + 2dB

[4] SM distance testing conditions: SM1 550/20us!260km/1 80s: The event is a whole roll of optical fiber. with no other events.

[5] MlM distance testing conditions: MM1300/2.5us/20km/1 80s: The event is a whole roll of optical fiber. with no other events.

Ordering information

Example:

Model:OT-200-2134-XX-MAF#1310/1550-12

12F OTDR, two wavelength 1310/1550,34dB dynamic range,MPO/APC/Female connector

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