S+C+L band tunable light source
Ultra-high wavelength accuracy, repeatability and stability, stable output power
Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal to noise ratio and edge mode compression ratio
Full band without mode hopping
C+L band or O band option
Product Details
Product Overview
S+C+L band tunable light source – Tunable light source is a necessary instrument for wavelength related testing of passive and active devices in the field of optical communication It can accurately and quickly adjust the appropriate wavelength to meet testing requirements, and can be paid with a high sampling rate power meter
Efficiently collect the power wavelength curve of the device and test its performance parameters at different wavelengths
TopLight Tunable Light Source is the first tunable light source developed by Dimension Technology, which integrates 16 years of professional experience in the field of optical testing It has high wavelength accuracy, fast scanning speed, high output power stability, and full
The characteristic of no mode hopping in the frequency band The product has high integration, compact size, flexible operation, and can be matched with the high speed power meter and polarization controller of Dimension Technology to meet all testing requirements of wavelength division multiplexing devices
S+C+L band tunable light source – แหล่งกำเนิดแสงแบบปรับค่าได้เป็นเครื่องมือที่จำเป็นสำหรับการทดสอบที่เกี่ยวข้องกับความยาวคลื่นของอุปกรณ์แบบพาสซีฟและแอ็กทีฟในด้านการสื่อสารด้วยแสง ซึ่งสามารถปรับความยาวคลื่นที่เหมาะสมได้อย่างแม่นยำและรวดเร็วเพื่อตอบสนองความต้องการในการทดสอบ และสามารถชำระด้วยมิเตอร์วัดกำลังไฟฟ้าด้วยอัตราการสุ่มตัวอย่างที่สูง อีกทั้งรวบรวมเส้นโค้งความยาวคลื่นพลังงานของอุปกรณ์ได้อย่างมีประสิทธิภาพและทดสอบพารามิเตอร์ประสิทธิภาพที่ความยาวคลื่นต่างๆ
Main advantages
Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal to noise ratio and edge mode compression ratio
Full band without mode hopping
C+L band or O band option
Main Applications
WDM scanning test
Optical passive system testing
Wavelength correlation test
Specific wavelength output
Spectrocopy
Ultra high wavelength accuracy, repeatability, and stability, with stable output power
The TopLight tunable light source guarantees a wavelength accuracy of ± 20pm through precision electrical control, ensuring reliable wavelength repeatability and stability even during high speed scanning In different
In the testing environment, TopLight can also compensate for environmental changes, ensuring stable and correlated wavelength accuracy
The output power of the light source is strictly fitted for wavelength correlation, ensuring that the flatness of the power curve is higher than 0.2dB/nm, reducing the error caused by power on the testing system
High output spectral signal to noise ratio and edge mode compression ratio
TopLight uses the principle of external activity response to tune the wavelength, and through precision optical and electrical control systems, guarantees that the narrow linewidth laser output from the resonant activity always has good signal to noise ratio and edge mode compression ratio, in order to achieve rigorous control
The wavelength scanning system provides Excel testing environment and conditions
Realize uniform and no mode hopping across the entire wavelength range, ensuring continuous wavelength curves
The integration capability of opto electromechanical computing in Dimension Technology provides reliable assurance for the mode control of tunable light sources Through precision control and algorithms, TopLight can ensure ultra high scanning speed and wavelength accuracy before
Please confirm that the last always outputs the dominant wavelength of the main mode, and the test can be completed without the need for wavelength calibration components during scanning&Nbsp;
Implementing Optical Device Scanning Testing with a Wavelength Scanning System
The wavelength scanning system independently developed by Dimension Technology is equipped with TopLight tunable light source and high speed power meter, with a wavelength accuracy of ± 5pm and a fast scanning speed of 100nm/s, providing a solution for wavelength related devices
Efficient and accurate testing solutions Based on years of design experience, Dimension Technology provides system software with good human machine interaction, allowing users to easily and clearly complete wavelet scanning tests with just a few steps
Click the button to obtain a detailed test report Furthermore, due to the platform+modular design architecture, the equipment of Dimension Technology has extremely high flexibility when demand changes occur, and can be upgraded by simply adding, reducing, or replacing modules
The new testing environment has saved users a lot of time and economic costs
Multiple selectable wavelength ranges, covering various device application scenarios
Performance Parameter
Ordering information
