Testing

Showing 17–21 of 21 results

  • PPC-03 Muller Polarization Controller – Dual Function High-Speed Polarization Control

    PPC-03 Muller Polarization Controller

    Generate orthogonal Mueller polarization states for swift polarization-dependent loss testing!
    • Dual functions of disturbance and polarization control
    • High speed disturbance function (max = 5MHz)
    • Channel polarization control range: 0-4 π
    • High speed polarization scanning (10kHz)
    • Serial port command control
    Read moreDone
  • PPC-04 Disturbance and Muller Polarizer for high-speed optical polarization testing

    PPC-04 Disturbance and Muller Polarizer

    Generates mutually orthogonal Mueller polarization states with high-speed 5MHz depolarization, enabling rapid polarization-related loss testing!

    • Dual functions of disturbance and polarization control
    • High speed disturbance function (max = 5MHz)
    • Channel polarization control range: 0-4 π
    • High speed polarization scanning (10kHz)
    • Serial port command control
    Read moreDone
  • Programmable Optical Attenuator

    Programmable Optical Attenuator

    Automated, rapid detection, and intelligent analysis of single-core, MPO, and other multi-fiber connectors.

    • Multimode EF (Encircled Flux) control, compliant with various source testing standards
    • Lower insertion loss, with attenuation rate increased by 200%
    • Built-in power monitoring with closed-loop monitoring, supporting three control modes
    • Supports custom task settings and programming
    • OMEGA series modular can integrate multiple functional modules into one for one-stop testing of optical devices
    • XHASIS series rack-mount has high density, compact size, easy deployment and low cost.

    Read moreDone
  • Scanning Slit Spot Analyzer Beamhere Series – High-Precision Laser Beam Measurement Device

    Scanning slit spot analyzer

    An innovative optical spot analyzer, domestically pioneered, featuring autonomous switching between knife-edge and slit-scanning modes.

    Knife edge slit dual mode
    µ m level small beam measurement
    0.1 µ m high resolution
    Measurable high power beam
    Innovative, precise, and compact structural design

    Read moreDone
  • SLED stable light source

    SLED stable light source

    Expandable and compatible with DIMENSION’s ALPHA and OMEGA universal optical test platforms.

    • 1CH, 2CH, or 4CH output available, each channel could be independently controlled.

    Wavelength and power can be customized.

    • Support USB / Ethernet / button controlling.

    • Modular design, high precision, high reliability interface with patent.

    Flexible disassembled SC/FC connector, convenient for post-maintenance.

    Read moreDone

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