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Ultra-high wavelength accuracy, repeatability and stability, stable output power
Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal to noise ratio and edge mode compression ratio
Full band without mode hopping
C+L band or O band option
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Ensuring high-speed power output with a wide dynamic range for high-speed applications!
• Continuous acquisition frequency up to 10KHz (full power range)
• Support automatic gain shift acquisition measurement in high-speed mode
• Each channel has a storage depth of up to 10 million
• Support continuous trigger acquisition mode
• Support single trigger batch acquisition mode
• Support fixed gain compensation setting
• User-configurable analog output port
• Support optical power detection range in high-speed mode: +10dBm~-70dBm
• Support any wavelength setting within the wavelength range of 850nm~1650nm
• Single module can provide 1, 2 or 4 channel optical power detection
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Ultra-high wavelength accuracy, repeatability and stability, stable output power
Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal to noise ratio and edge mode compression ratio
Full band without mode hopping
C+L band or O band option
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Modular Chassis for Customizable Test & Measurement Solutions
Separated hardware architecture design.
Platform + modular design.
Built-in slot recognition and power-on control, supporting hot-swapping.
Supports network and USB control, enabling multiple test instruments to work together for automated testing systems.
Adopts the Intel Skylake-U architecture with an onboard Core i5 CPU.
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Generate orthogonal Mueller polarization states for swift polarization-dependent loss testing!
- Dual functions of disturbance and polarization control
- High speed disturbance function (max = 5MHz)
- Channel polarization control range: 0-4 π
- High speed polarization scanning (10kHz)
- Serial port command control
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Flexible and scalable
High precision and reliability
Reusable light source
Integrated systematic software architecture
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Ultra-high wavelength accuracy, repeatability and stability, stable output power
Wavelength accuracy ± 20pm
Scanning speed of 100nm/s
High signal to noise ratio and edge mode compression ratio
Full band without mode hopping
C+L band or O band option
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- Flexible and scalable
- High precision and reliability
- Reusable light source
- Integrated systematic software architecture
- Product Details
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