Tunable Light Source

Showing all 8 results

  • E+S Band Tunable Light SourceE+S Band Tunable Light Source

    E+S band tunable light source

    Ultra-high wavelength accuracy, repeatability and stability, stable output power

    Wavelength accuracy ± 20pm
    Scanning speed of 100nm/s
    High signal to noise ratio and edge mode compression ratio
    Full band without mode hopping
    C+L band or O band option

  • High-speed Optical Power Meter

    High-speed Optical Power Meter

    Ensuring high-speed power output with a wide dynamic range for high-speed applications!

    • Continuous acquisition frequency up to 10KHz (full power range)
    • Support automatic gain shift acquisition measurement in high-speed mode
    • Each channel has a storage depth of up to 10 million
    • Support continuous trigger acquisition mode
    • Support single trigger batch acquisition mode
    • Support fixed gain compensation setting
    • User-configurable analog output port
    • Support optical power detection range in high-speed mode: +10dBm~-70dBm
    • Support any wavelength setting within the wavelength range of 850nm~1650nm
    • Single module can provide 1, 2 or 4 channel optical power detection

  • O band tunable light source 1260–1360nm by Dimension

    O (1260-1360nm) tunable light source

    Ultra-high wavelength accuracy, repeatability and stability, stable output power

    Wavelength accuracy ± 20pm
    Scanning speed of 100nm/s
    High signal to noise ratio and edge mode compression ratio
    Full band without mode hopping
    C+L band or O band option

  • OMEGA Testing Platform

    OMEGA Testing Platform

    Modular Chassis for Customizable Test & Measurement Solutions

    Separated hardware architecture design.

    Platform + modular design.

    Built-in slot recognition and power-on control, supporting hot-swapping.

    Supports network and USB control, enabling multiple test instruments to work together for automated testing systems.

    Adopts the Intel Skylake-U architecture with an onboard Core i5 CPU.

  • PPC-03 Muller Polarization Controller – Dual Function High-Speed Polarization Control

    PPC-03 Muller Polarization Controller

    Generate orthogonal Mueller polarization states for swift polarization-dependent loss testing!
    • Dual functions of disturbance and polarization control
    • High speed disturbance function (max = 5MHz)
    • Channel polarization control range: 0-4 π
    • High speed polarization scanning (10kHz)
    • Serial port command control
  • RST Return Loss Scanning System for WDM device testing

    RST return loss scanning system

    Flexible and scalable

    High precision and reliability

    Reusable light source

    Integrated systematic software architecture

  • S+C+L Band Tunable Light Source High Accuracy and Stability

    S+C+L band tunable light source

    Ultra-high wavelength accuracy, repeatability and stability, stable output power

    Wavelength accuracy ± 20pm
    Scanning speed of 100nm/s
    High signal to noise ratio and edge mode compression ratio
    Full band without mode hopping
    C+L band or O band option

  • RST Return Loss Scanning System for WDM device testing

    WST wavelength scanning system

    • Flexible and scalable
    • High precision and reliability
    • Reusable light source
    • Integrated systematic software architecture
    • Product Details

End of content

End of content