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- Automatic alignment with excellent repeatability based on optimized alignment algorithms and precision stage control
- Automatic gap control and angle alignment using a precision displacement sensor
- Quick input port alignment with multimode fibers
- Fast initial alignment based on vision processing and 2D scanning algorithm
- Convenient graphic user interface (GUI) and versatile functions for data management
- Remote controlled via user software
- Compact mechanical design
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- Wafer level tester for up to 12-inch wafers (depending on probe station)
- Automatic input/output coupling (wafer level vertical coupling)
- Coupling to fiber array block and/or optical fiber
- Convenient graphic user interface (GUI)
- Versatile alignment functions using image processing and contact sensors
- Automatic height control system
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